Combining the reliability of spectrally resolved detection with an ultrabroad spectral coverage of up to 250-2100 nm makes our White Light Interferometer the ideal instrument for ultrafast optics characterization and quality control.
Our White Light Interferometer uses spectrally resolved interferometry to accurately measure the Group Delay Dispersion (GDD) of multi-layer ultrafast optics. The device has been developed at the Max-Planck Institute for Quantum Optics (Garching, Germany) to characterize and refine some of the most advanced coatings to date.[1-4] Combining spectral with temporal information and the possibility to accumulate multiple passes over the same optic ensures reliable results with unique spectral coverage of up to 250-1100 nm (UV/vis/NIR version) and 900-2100 nm (IR version). Spectrally resolved detection makes reference lasers together with any related test sample restrictions on specific reflection or transmission bands obsolete. This opens the full spectral range to characterize even ultra-broadband or advanced narrowband coatings. The flexible optical setup can measure mirrors and transparent samples under angles of incidence variable between 0 and 70 degrees.
- Ultrabroad spectral coverage:
up to 250-1100 nm (UV/vis/NIR version)
900-2100 nm (IR version)
- Direct spectrally dispersed measurement with a spectrometer
- No need for reference lasers, no requirements on specific reflectivity
- 0-70 degree angle of incidence
- measurement of single mirrors or mirror pairs
- s and p polarization
- Complete with laptop and user-friendly software interface
Examples of Group delay dispersion (GDD) measurements with the White Light Interferometer, and comparison to the theoretical design curves. (a) Ultrabroadband PC70 mirrors with our propriatary double-angle design, measured with 5 and 19 degrees angle of incidence, and average of the two curves. (b) High dispersive HD73 compression mirror with -3000 fs2 per bounce at 1030 nm. Differences between measurement and theoretical GDD curve are due to tolerances in the manufacturing process.
- M. Th. Hassan, T. T. Luu, A. Moulet, O. Raskazovskaya, P. Zhokhov, M. Garg, N. Karpowicz, A. M. Zheltikov, V. Pervak, F. Krausz, E. Goulielmakis, Optical attosecond pulses and tracking the nonlinear response of bound electrons, Nature 2016, 530, 66.
- E. Fedulova, K. Fritsch, J. Brons, O. Pronin, T. Amotchkina, M. Trubetskov, F. Krausz, V. Pervak, Highly-dispersive mirrors reach new levels of dispersion, Opt. Expr. 2015, 23, 13788.
- V. Pervak, Appl. Opt. 2011, Recent development and new ideas in the field of dispersive multilayer optics, 50, C55,
- T. V. Amotchkina, A. V. Tikhonravov, M. K. Trubetskov, D. Grupe, A. Apolonski, V. Pervakm, Measurement of group delay of dispersive mirrors with white-light interferometer, Appl. Opt. 2009, 48, 949.